TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
Resolution mode for high-resolution imaging Field mode for large field of view imaging Depth mode for high depth of focus imaging Beam Rocking mode for Selected Area Electron Channeling and live 3D ...
Backscattered Electron and X-Ray (BEX) imaging is a method for Scanning Electron Microscopy (SEM) which obtains data from both X-Ray sensors, such as silicon drift detector, and Backscattered Electron ...
Figure 1 (a) Structure of the mesoscopic objective, (b) Aberration distribution of the mesoscopic objective, (c) Wide-field imaging system built with the mesoscopic objective, (d) Laser point-scanning ...
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