For quality control purposes, wafers, such as semiconductor or flat-panel display (FPD) chips, need to be examined under a microscope to verify that they meet specifications related to both circuit ...

A new technical paper titled “DECOR: Deep Embedding Clustering with Orientation Robustness” was published by researchers at Oregon State University and Micron Technology. “In semiconductor ...

YORKTOWN HEIGHTS, N.Y. — IBM Corp. has grown catalyst-free nanotube networks on silicon carbide substrates, the company said last week. With atomic-force microscopy verifying the results, researchers ...

This technology has been developed to inspect semiconductor wafers and identify flaws and features on a nano-technology scale. However, the sensors, algorithms, neural network systems, optics and ...

Building semiconductors is an incredibly exacting process, with critical dimensions posing significant equipment challenges – and with the possibility that small process excursions can cause the yield ...

In this section, the manufacturing requirements associated with advanced semiconductor lithography are discussed. This is followed by a discussion of lithographic approaches being used or being ...

Semiconductor chips consist of dozens of layers, packing immense computing power into a compact form. They store and retrieve data for signaling and control and are essential in creating central ...