Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...

Pipeline defect analysis and assessment remains a critical area of research, given its direct impact on the safety and reliability of energy transportation infrastructures. Mechanical defects such as ...

SiC is extensively used in microelectronic devices owing to its several unique properties. However, low yield and high cost of the SiC manufacturing process are the major challenges that must be ...

Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...

Semiconductor manufacturing creates a wealth of data – from materials, products, factory subsystems and equipment. But how do we best utilize that information to optimize processes and reach the goal ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

Solid rocket motors (SRMs), extensively used in aerospace and missile systems, employ CFRP composites in motor casings due to their superior mechanical properties. However, the bonding interface ...