Most simple circuits you'll find for measuring reactive components cover only a limited range of component values. Here's a circuit built from a handful of inexpensive parts that will let you measure ...

In back-end semiconductor processing it is important to improve the performance of semiconductors due to the limitations of miniaturization in front-end processes. To achieve this goal, the industry ...

Scanning microwave microscopy (SMM) is a scanning probe method that uses the S11 parameter to calculate the local tip-sample microwave impedance. This impedance is affected by the sample’s local ...

A capacitor measured with a $100 handheld multi-meter can give a substantially different result than the same capacitor measured with a $10,000 LCR meter. That same capacitor measured with two ...

Capacitive sensors are found in a wide range of equipment, from consumer electronics to industrial/process control. Touch buttons are increasingly found in lamps and dimmers. Motion detectors can ...

Scanning Capacitance Microscopy (SCM) and Scanning Spreading Resistance Microscopy (SSRM) are both well-established scanning probe-based techniques for two-dimensional carrier profiling. Driven by the ...

During the manufacture of semiconductor wafers, thickness measurement forms an important part of this process, since it provides process engineers with the information required to ensure that ...