VAN DEN BROEK, A. Intra-atomic Charge and the Structure of the Atom. Nature 92, 476–478 (1913). https://doi.org/10.1038/092476b0 ...
In scanning transmission electron microscopy (STEM), single atoms can be imaged by detecting electrons scattered through high angles using post-specimen, annular-type detectors. Recently, it has been ...
The charge state of individual silicon atoms deposited on a surface can be selectively controlled via nanoscale contacts, according to researchers at Canada’s National Institute for Nanotechnology.
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