Annular dark field scanning electron microscopy images of a bilayer interface after heat pulses at 500° (left), 600° (middle) and 700° (right). Dashed colored lines mark the positions of the interface ...
Highly efficient controlling the individual atomic migration is the basis of the modern atomic manufacturing. Although one-by-one atom migration can be realized precisely by STM technique, such a ...
(Nanowerk News) Silicon-based electronics are approaching their physical limitations and new materials are needed to keep up with current technological demands. Two-dimensional (2D) materials have a ...